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Controlling the mass bias introduced by anionic and organic matrices in silicon isotopic measurements by MC-ICP-MS

dc.contributor.authorHughes, H.
dc.contributor.authorDelvigne, C.
dc.contributor.authorKorntheuer , M.
dc.contributor.authorde Jong , J.
dc.contributor.authorAndré, L.
dc.contributor.authorCardinal, D.
dc.date2011
dc.date.accessioned2016-03-15T10:04:54Z
dc.date.available2016-03-15T10:04:54Z
dc.identifier.urihttps://orfeo.belnet.be/handle/internal/1138
dc.languageeng
dc.titleControlling the mass bias introduced by anionic and organic matrices in silicon isotopic measurements by MC-ICP-MS
dc.typeArticle
dc.subject.frascatiEarth and related Environmental sciences
dc.audienceScientific
dc.subject.freeSurface environments and collection management
dc.source.titleJournal of Analytical Atomic Spectrometry
dc.source.volume26
dc.source.page1892-1896
Orfeo.peerreviewedYes
dc.identifier.rmca3149


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