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The Venus Emissivity Mapper (VEM): instrument design and development for VERITAS and EnVision

dc.contributor.authorHagelschuer, T.
dc.contributor.authorPertenais, M.
dc.contributor.authorWalter, I.
dc.contributor.authorDern, P.
dc.contributor.authordel Togno, S.
dc.contributor.authorSäuberlich, T.
dc.contributor.authorPohl, A.
dc.contributor.authorRosas Ortiz, Y.M.
dc.contributor.authorWesterdorff, K.
dc.contributor.authorKopp, E.
dc.contributor.authorFitzner, A.
dc.contributor.authorArcos Carrasco, C.
dc.contributor.authorWendler, D.
dc.contributor.authorUlmer, B.
dc.contributor.authorZiemke, C.
dc.contributor.authorRufini Mastropasqua, S.
dc.contributor.authorLötzke, H.-G.
dc.contributor.authorAlemanno, G.
dc.contributor.authorCarron, J.
dc.contributor.authorRéess, J.M.
dc.contributor.authorVandaele, A.C.
dc.contributor.authorRobert, S.
dc.contributor.authorMarcq, E.
dc.contributor.authorHelbert, J.
dc.contributor.authorPeter, G.
dc.date2024
dc.date.accessioned2024-10-14T15:38:42Z
dc.date.available2024-10-14T15:38:42Z
dc.identifier.urihttps://orfeo.belnet.be/handle/internal/13467
dc.descriptionWe report on the current Venus Emissivity Mapper (VEM) instrument design and development status onboard NASAs Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy (VERITAS) and ESAs EnVision orbiters. The VEM instrument is a push broom multispectral imager that comprises an optical system based on a sophisticated filter assembly with 14 spectral bands and an InGaAs detector with integrated thermoelectric cooler. A turn window mechanism and a two-staged baffle in front of the optics protect the instrument against contamination and straylight. The instruments nominal mass is approximately 6 kg. VEM opens the path for mapping Venus surface emission with a global coverage of >70%.
dc.languageeng
dc.titleThe Venus Emissivity Mapper (VEM): instrument design and development for VERITAS and EnVision
dc.typeConference
dc.subject.frascatiPhysical sciences
dc.audienceScientific
dc.subject.freeVERITAS
dc.subject.freeVEM
dc.subject.freeEnVision
dc.subject.freeVenSpec-M
dc.subject.freeVenus
dc.subject.freeIR
dc.subject.freeN-IR
dc.source.titleInfrared Remote Sensing and Instrumentation XXXII, Proceedings of the optical engineering + applications conference, 18-23 August 2024, San Diego, USA
dc.source.volume13144
dc.source.page131440G
Orfeo.peerreviewedNo
dc.identifier.doi10.1117/12.3028082
dc.identifier.url
dc.source.editorStrojnik, M.
dc.source.editorHelbert, J.


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