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High resolution DEM from Tandem-X interferometry: an accurate tool to characterize volcanic activity

dc.contributor.authorAlbino, F.
dc.contributor.authorKervyn, F.
dc.date2013
dc.date.accessioned2016-03-15T10:05:36Z
dc.date.available2016-03-15T10:05:36Z
dc.identifier.urihttps://orfeo.belnet.be/handle/internal/1713
dc.languageeng
dc.titleHigh resolution DEM from Tandem-X interferometry: an accurate tool to characterize volcanic activity
dc.typeConference
dc.subject.frascatiEarth and related Environmental sciences
dc.audienceScientific
dc.subject.freeNatural hazards
dc.source.titleEuropean Geosciences Union (EGU), Geophysical Research Abstracts
dc.source.volumevol. 15
Orfeo.peerreviewedNo
dc.identifier.rmca3262


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