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Use of a Langmuir Probe Instrument on Board a Pico-Satellite

dc.contributor.authorRanvier, S.
dc.contributor.authorAnciaux, M.
dc.contributor.authorCardoen, P.
dc.contributor.authorGamby, E.
dc.contributor.authorBonnewijn, S.
dc.contributor.authorDe Keyser, J.
dc.contributor.authorPieroux, D.
dc.contributor.authorLebreton J.P.
dc.date2017
dc.date.accessioned2017-08-04T11:03:08Z
dc.date.available2017-08-04T11:03:08Z
dc.identifier.urihttps://orfeo.belnet.be/handle/internal/5948
dc.descriptionThe sweeping Langmuir probe instrument is a part of the payload of PICo-satellite for atmospheric and space science observations (PICASSO), an ESA in-orbit demonstrator. It includes four thin cylindrical probes whose electrical potential is swept to measure both plasma density and electron temperature together with the spacecraft (S/C) potential. PICASSO is a triple unit CubeSat of dimensions $340.5 mm x 100 mm x 100$ mm. The orbit is expected to be a high inclination low-earth orbit. The main issue implied by the use of a pico-satellite platform for a Langmuir probe instrument is the limited conducting area of the S/C, which leads to S/C charging and drift of the instrument's electrical ground during the measurement. A specific measurement technique that includes the simultaneous measurement of the potential and current of different probes has been developed to retrieve consistent current-voltage characteristics that can be used to estimate the plasma parameters mentioned above.
dc.languageeng
dc.titleUse of a Langmuir Probe Instrument on Board a Pico-Satellite
dc.typeArticle
dc.subject.frascatiPhysical sciences
dc.audienceScientific
dc.subject.freeCommunication satellites
dc.subject.freeElectric potential
dc.subject.freeElectron temperature
dc.subject.freeLangmuir probes
dc.subject.freePlasma density
dc.subject.freeProbes
dc.subject.freeSatellites
dc.subject.freeSpace flight
dc.subject.freeSpacecraft
dc.subject.freeTemperature measurement
dc.subject.freeCubesat
dc.subject.freeElectrical ground
dc.subject.freeElectrical potential
dc.subject.freeExtraterrestrial measurements
dc.subject.freeMeasurement techniques
dc.subject.freePlasma physics
dc.subject.freePlasma temperature
dc.subject.freeSimultaneous measurement
dc.subject.freeOrbits
dc.source.titleIEEE Transactions on Plasma Science
dc.source.volume45
dc.source.issue8
dc.source.page2007-2012
Orfeo.peerreviewedYes
dc.identifier.doi10.1109/TPS.2017.2700211
dc.identifier.scopus2-s2.0-85021838603


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