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    Fourier transform spectroscopy of the O2 Herzberg bands. II. Band oscillator strengths and transition moments

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    Authors
    Mérienne, M.-F.
    Jenouvrier, A.
    Coquart, B.
    Carleer, M.
    Fally, S.
    Colin, R.
    Vandaele, A.C.
    Hermans, C.
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    Subject
    Absorption spectroscopy
    Dissociation
    Electron energy levels
    Electron transitions
    Fourier transforms
    Light absorption
    Oxygen
    Solar radiation
    Spectrometers
    Spectrum analysis
    Band oscillator strengths
    Fourier transform spectroscopy
    Herzberg bands
    Transition moments
    Molecular spectroscopy
    Audience
    Scientific
    Date
    2000
    Metadata
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    Description
    From absorption spectra obtained at high resolution by coupling a Fourier transform spectrometer to a long-path multiple reflection cell the intensities of the O2 Herzberg bands (A3Σu+-X3Σg-, c1Σu-, A′ 3Δu-X3Σg-) have been studied at ambient temperature. The integrated cross section values are given for the lines of the (v′-0) bands in the A3ΣuPLU-X3Σg-, c1Σu--X3Σg-, and A′ 3Δu-X3Σg- transitions with v′ = 0-11, v′ = 2-19, and v′ = 2-12, respectively. The band oscillator strengths have been deduced and transition moments have been calculated. The total absorption values in the region of the Herzberg bands together with the photoabsorption values determined previously above the dissociation limit can be modeled by a single curve, in agreement with the continuity relationship of the cross sections through the dissociation limit.
    Citation
    Mérienne, M.-F.; Jenouvrier, A.; Coquart, B.; Carleer, M.; Fally, S.; Colin, R.; Vandaele, A.C.; Hermans, C. (2000). Fourier transform spectroscopy of the O2 Herzberg bands. II. Band oscillator strengths and transition moments. , Journal of molecular spectroscopy, Vol. 202, Issue 2, 171-193, DOI: 10.1006/jmsp.2000.8126.
    Identifiers
    uri: https://orfeo.belnet.be/handle/internal/6132
    doi: http://dx.doi.org/10.1006/jmsp.2000.8126
    scopus: 2-s2.0-0343972354
    Type
    Article
    Peer-Review
    Yes
    Language
    eng
    Links
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