Recent developments of wide-bandgap semiconductor based UV sensors
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Authors
BenMoussa, A.
Soltani, A.
Schühle, U.
Haenen, K.
Chong, Y.M.
Zhang, W.J.
Dahal, R.
Lin, J.Y.
Jiang, H.X.
Barkad, H.A.
BenMoussa, B.
Bolsee, D.
Hermans, C.
Kroth, U.
Laubis, C.
Mortet, V.
De Jaeger, J.C.
Giordanengo, B.
Richter, M.
Scholze, F.
Hochedez, J.F.
Discipline
Physical sciences
Subject
AlN
Aluminium nitride
Cubic boron nitride (cBN)
Four-order
Future mission
High breakdown voltage
Metal semiconductor metal
MSM
MSM photodetector
Rejection ratios
Responsivity
Solar research
Solar-blind photodetectors
Solarblind
Space astronomy
UV irradiation
UV photodetector
UV sensor
UV- and
Vacuum ultraviolets
VUV radiation
Wavelength ranges
WBGM
Wide band-gap material
Wide-band-gap semiconductor
Wurtzite
Aluminum compounds
Boron
Boron nitride
Cubic boron nitride
Current voltage characteristics
Diamonds
Electric conductivity
Energy gap
Heterojunction bipolar transistors
Ionization of gases
Nitrides
Optoelectronic devices
Sensors
Zinc sulfide
Photodetectors
Audience
Scientific
Date
2009Metadata
Show full item recordDescription
Future missions for space astronomy and solar research require innovative vacuum ultraviolet (VUV) photodetectors. Present UV and VUV detectors exhibit serious limitations in performance, technology complexity and lifetime stability. New developments of metal-semiconductor-metal (MSM) solar-blind photodetectors based on diamond, cubic boron nitride (c-BN), and wurtzite aluminium nitride (AlN) are reported. In the wavelength range of interest, the characteristics of the MSM photodetectors present extremely low dark current, high breakdown voltage, and good responsivity. Diamond, c-BN, and AlN MSM photodetectors are sensitive and stable under UV irradiation. They show a 200 nm to 400 nm rejection ratio of more than four orders of magnitude and demonstrate the advantages of wide band gap materials for VUV radiation detection in space. © 2008 Elsevier B.V.
Citation
BenMoussa, A.; Soltani, A.; Schühle, U.; Haenen, K.; Chong, Y.M.; Zhang, W.J.; Dahal, R.; Lin, J.Y.; Jiang, H.X.; Barkad, H.A.; BenMoussa, B.; Bolsee, D.; Hermans, C.; Kroth, U.; Laubis, C.; Mortet, V.; De Jaeger, J.C.; Giordanengo, B.; Richter, M.; Scholze, F.; Hochedez, J.F. (2009). Recent developments of wide-bandgap semiconductor based UV sensors. , Diamond and Related Materials, Vol. 18, Issue 5-8, 860-864, DOI: 10.1016/j.diamond.2008.11.013.Identifiers
scopus: 2-s2.0-67349263464
Type
Article
Peer-Review
Yes
Language
eng